| Model Name |
Solar Cell In-Line Inspection System K3500 |
| System Model |
ELX : EL Measurement
PLX : PL Measurement
WFX : AOI+I-V+EL/PL |
| System Configuration |
Loader, AOI(Vision), K3000 I-V System,
K3300 Imaging System, Unloader, Sorting |
| System Tact Time |
1,200EA per 1hour |
| Measurement |
Voltage, Current, Temperature, Irradiance (Ref),
Mircro Crack, Hot Spot, Finger Defect, Dark Area,
Isc Mapping, Relative Efficiency, Color, Vision |
| Dimension |
(W)5350mm x (D)1400mm x (H)2130mm |
| Test Sample |
Si Solar Cell |