Information

 

Sollar Cell Test System 

  • Model : K3300
  • Company : McScience
  • Country : Korea

Solar Cell Inspection Tool Using Luminescence Imaging and Laser Scanning

Introduction

This system provides various imaging test solutions such as electroluminescence, photoluminescence, thermal imaging, and light beam
induced current measurement for inspection of solar cell’s internal defects and device failures.

  • Electroluminescence Imaging
  • Photoluminescence Imaging
  • Light Beam Induced Current Imaging
  • Thermal Imaging
  • Automatic Detection of Microcrack, Dark Area & Finger Defect

 

 تست سولار سل

Specification

Model Name  Solar Cell Imaging System K3300
System Model  ELX : EL Measurement / PLX : PL Measurement / EPLI : EL+PL / EPLB : EL+PL+ LBIC Measurement
System Configuration  K301 Camera Set, [K103 ELX DC Power Supply : Using ELX], [K310 LD Driver, LED, LASER : Using PLX], Main frame, Box Table
 [Motion : Using Semi Auto ELX], Controller, PC, ACC
Measure Time  EL : <10sec, PL : <10sec, LBIC : 2 hour (6” Cell)
Measurement  Mircro Crack, Hot Spot, Finger Defect, Dark Area, Isc Mapping, Relative Efficiency
Dimension  ELX & PLX – [Size : (W)600mm x (d)1,000mm x (H)1,800mm / Weight : <100Kg / Utility : 200V, 15A, Air 6 Bar]
 EPLI & EPLB – [Size : (W)1,200mm x (d)1,000mm x (H)1,800mm / Weight : <300Kg / Utility : 200V, 15A, Air 6 Bar]
Test Sample  Crystaline 5”, 6”, Si Solar Cell

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