| TWIST-TUBE |
Easy switch between point and line focus. Available anodes: Cr, Cu, Mo, Ag. Max. Power and filament: up to 3 kW (0,4 x 16 mm²), depending on anode material. Patent: EP 1 923 900 B1 |
Quick change of the wavelength to perfectly match different applications. Fastest switch between line and point focus for a wider range of applications and better results in shorter time. |
| Iµs Microfocus Source |
Power load: up to 50 W, single-phase power. MONTEL and MONTEL Plus optics combining parallel and focusing mirrors. Beam sizes down to 180 x 180 µm². Maximum integrated flux 8 x 10⁸ cps at mirror exit. Beam divergence down to 0,5 mrad. |
Millimeter sized beam with high brilliance and ultra-low background. Green design with low power consumption, no water consumption and extended life components. Optimize the beam shape and divergence for best results. |
| TXS-HE X-Ray Source |
Compact and light design for vertical ATLAS goniometer. Line focus, 0.3x3 mm². Focal Brightness of 6 kW/mm². Anode materials: Cu, Co, Cr, Mo. Max. voltage 50 kV, max. power depending on anode material: Cr 3.2 kW, Cu/Mo 5.4 kW, Co 2,8 kW. Pre-Aligned Tungsten filament. |
High flux X-ray source that allows for horizontal sample mounting. Up to 5 times more intensity compared to standard ceramic X-ray sources. Perfectly suited for line and spot focus applications. Pre-Aligned filament allow fast filament exchange with a minimum of re-alignment requirement. |
| TRIO Optics |
Software push-button switch between: Motorized Divergence Slit (Bragg-Brentano), High Intensity Ka1,2 Parallel Beam, High Resolution Ka1 Parallel Beam. Patents: US10429326, US6665372, US7983389. |
Fully automatic, motorized switching between up to 6 different beam geometries without any manual user intervention. Perfectly suited for all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial). |
| High-Resolution Monochromators |
Ge(220) and Ge(004) reflections in symmetric and asymmetric geometry. 2-bounce and 4-bounce (Bartels type) monochromators. Alignment-free mounting through SNAP.LOCK technology. |
Broad choice for best resolution vs. intensity balancing to obtain best possible results. Fast exchange of monochromators to optimize to different samples. |
| ATLAS™ Goniometer |
Vertical goniometer with enforced mechanics designed to host TXS-HE X-ray source. Industry leading angular accuracy: ±0.007° 2θ guaranteed over the entire angular range determined on NIST SRM 1976. Seamless integration of D8 family of components, including optics, positioning cameras, sample stage, nonambient and detector technologies. |
Unparalleled accuracy and precision as manifested by Bruker's unique alignment guarantee. Absolutely maintenance free drive mechanism / gearings with lifetime lubrication. Supports the full range of applications to generate highest accuracy data. |
| Non-Coplanar Arm |
Third goniometer axis for investigating ultra-thin layers and in-plane sample properties: Min. step size: 0.001°. Max. 2θ range (depending on the configuration): 160°. Automated detector distance detection. |
Unmatched accuracy with direct angular encoder. Seamless integration in DIFFRAC.SUITE software. Up to 160° 2θ range for most accurate Non-Coplanar structure determination. Real-time calibration for EIGER2 detector. |
| Compact UMC Stages |
Compact UMC Plus 80: Fast spinner for XRPD. Max. (x,y) translation: +/- 40 mm. Max. sample height: 57 mm. Compact UMC Plus 150: Max. (x,y) translation: +/- 75 mm. Max. sample height: 57 mm. Vacuum and electric feedthroughs for wafer chuck and tilt stages. |
Seamless switching between Thin Film research and Powder diffraction mode. 5 position sample changer for 51 mm sample diameter. 9 position sample changer for 32 mm sample diameter. Mapping of 2-4” wafers. Mapping of 6-8” wafers. Reflection mode 96 well plate capability. Allows for infinite Phi rotation with connected Tilt-stage and vacuum without a need to care for cables or vacuum pipe. |
| Centric Eulerian Cradle (CEC) |
Five degrees of freedom sample stage: x,y for sample translation of +/-40 mm. z-Drive for height alignment. Phi drive with 360° rotation freedom. Psi drive and angular range from -11° to 98°. Max. weight load: 1 kg. Various stage attachment available. |
Stress and Texture measurements in side-inclination mode for more accurate results. Automated mapping capability in (x,y). Motorized tilt-stage for precise surface alignment. Powder- or capillary spinners allow for powder diffraction. Bayonet sample stage holder for fast and reproducible swapping with other stages. |
| Pathfinder Plus Optics |
Software push-button switch between: Motorized Slit, 2-bounce Ge Analyzer, Automated absorber integrated. |
Fully automatic, motorized switching between two different optics without any manual user intervention. Maintains full field of view of LYNXEYE detectors. Absorber ensures linearity in measured data. |
| LYNXEYE XE-T |
Energy Resolution: < 380 eV @ 8 KeV. Detection Modes: 0D,1D, 2D. Wavelengths: Cr, Co, Cu, Mo and Ag. Patents: EP1647840, EP1510811, US20200033275. |
No need for Kß filters and secondary monochromators. 100% filtering of Fe-fluorescense with Cu radiation. Up to 450 times faster than conventional detector systems. Bragg2D: Collect 2D data with a divergent primary line beam. Unique detector warranty: No defective channels at delivery time. |
| EIGER2 |
The latest generation multi-mode (0D/1D/2D) detector based on the Hybrid Photon Counting technology, developed by Dectris Ltd. |
Seamless integration of 0D, 1D and 2D detection in step, continuous and advanced scanning modes. Ergonomic, alignment-free detector rotation to optimize γ or 2Θ angular coverage. Panoramic, tool-free diffracted beam optics using the complete detector field of view. Continuously variable detector positioning to balance angular coverage and resolution. |
| Non-ambient |
Temperature: Ranging from ~12 K up to ~2500 K. Pressure: 10-⁴ mbar up to 100 bar. Humidity: 5% to 95% RH. |
Investigations under ambient and non-ambient conditions. Easily exchanged stages with DIFFRAC.DAVINCI. |