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مشخصه
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توضیح
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آشکارساز اسپکتروفتومتر UV-Vis
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Standard Integrating Sphere (inner coating: BaSO4)
•60 mm Standard Integrating Sphere (4-port type): Incident angle on reflective sample: Sample side: 8º, reference side: 0º
•60 mm Standard Integrating Sphere (4-port type): Incident angle on reflective sample: Sample side and reference side;10º
•60 mm Standard Full Integrating Sphere (2-port type)
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High-sensitivity integrating sphere (inner coating: Spectralon )
•60 mm High-sensitivity Integrating Sphere (4-port type): Incident angle on reflective sample: Sample side: 8º, reference side: 0º
•60 mm High-sensitivity Full Integrating Sphere (2-port type)
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Direct light detector
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محدوده تنظیم طول موج اسپکترومتر UV-Vis
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175 - 3,300 nm
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محدوده اندازه گیری طول موج اسپکتروسکوپی UV-Vis
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Integrating sphere detection system *1Item
240 - 2,600 nm
190 - 2,600 nm
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Direct light detection system
185 - 3,300 nm
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منوکروماتور اسپکتروسکوپی UV-Vis
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Prism-Grating, Double monochromator, Pre-monochromator: Littrow monochromator using a prism, Main monochromator: Czerny-Turner monochromator using Diffraction grating (2 switchable diffraction gratings)
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محفظه نمونه اسپکتروفتومتر UV-Vis
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Sample compartment located on the table top and constructed to allow large samples Interior dimensions: 680 (W) × 470 (D) × 300 (H) mm, Light beam path length: 200 mm
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شناساگر طول موج اسپکترومتر UV-Vis
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In units of 0.01 nm
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شناساگر پهنای slit اسپکتروسکوپی UV-Vis
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UV and visible regions: Automatic control, and selection of a slit width from 0.01 to 2.4 nm in increments of 0.01 nm and from 2.4 to 8.0 nm in increments of 0.02 nm Near infrared region: Automatic control, and selection of a slit width from 0.1 to 20.0 nm in increments of 0.1 nm
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دقت طول موج طیف سنجی مرئی - فرابنفش
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UV and visible regions: ± 0.2 nm, Near infrared region: ± 1.0 nm, Automatic wavelength calibration function is incorporated
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تنطیمات تکرار پذیری اسپکتروفتومتر UV-Vis
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UV and visible regions: ± 0.1 nm, Near infrared region: ± 0.5 nm
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سرعت اسکن طول موج اسپکترومتر UV-Vis
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Visible region: 0.3, 3, 15, 30, 60, 120, 300, 600, 1,200, and 2,400; Near infrared region: 0.75, 7.5, 37.5, 75, 150, 300, 750, 1,200, 1,500, 3,000, and 6,000 Go to λ: 3,600 nm/min (9,000 nm/min for near infrared region)
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منبع نور اسپکتروفتومتر UV-Vis
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UV region: Deuterium lamp (mountable by one touch), Visible and near infrared regions: 50 W Tungsten-halogen lamp (long life of 1,000 hours)
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سیستم سوییچینگ منبع نور اسپکترومتر UV-Vis
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Automatic switching at a specified wavelength between 325 nm to 370 nm
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متد فتومتریک اسپکتروسکوپی UV-Vis
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Double beam direct ratio photometry (Measurement of negative absorbance or transmittance/reflectance of more than 100% is possible owing to Hitachi-original differential feedback method) UV and visible regions: Negative voltage control method and slit control method; Near infrared region: slit control method and fixed slit method
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حالت فتومتریک اسپکتروفتومتر UV-Vis
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Absorbance (Abs), transmittance (%T), reflectance (%R), reference side energy (E(R))/ sample side energy (E(S))
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محدوده فتومتریک اسپکترومتر UV-Vis
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Absorbance: -2 to- +5.0 (in units of 0.001 Abs); Transmittance/reflectance: 0 - 999.99 (in units of 0.01%)
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دقت فتومتریک اسپکتروسکوپی UV-Vis
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Certified according to NIST SRM 930: ± 0.002 Abs (0 - 0.5 Abs), ± 0.004 Abs (0.5 - 1.0 Abs), ± 0.3%
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تکرارپذیری فتومتریک اسپکتروفتومتر UV-Vis
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Certified according to NIST SRM 930: ± 0.001 Abs (0 - 0.5 Abs), ± 0.002 Abs (0.5 - 1.0 Abs), ± 0.1%T
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مدت زمان واکنش اسپکترومتر UV-Vis
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An optimum response is automatically selected under given slit width and wavelength scan-speed.
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پایداری بیس لاین اسپکتروفتومتر UV-Vis
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Two hours later after power-On: Less than 0.0004 Abs/ 60 minutes (340 nm)
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واحد پردازش داده ها اسپکتروفتومتر UV-Vis
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PC: OS; Windows® 7 Professional (32 bit or 64 bit)
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دمای عملکرد اسپکتروفتومتر UV-Vis
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15 - 35ºC
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رطوبت قابل اجرا اسپکتروفتومتر UV-Vis
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25 - 80% (No condensing, 70% or less under temperatures of 30ºC or higher)
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ابعاد فیزیکی – وزن اسپکتروفتومتر UV-Vis
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900 (W) × 760 (D) × 1,180 (H) mm, 160 kg
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